2015

Microsopy and Microanalysis 2015 2.-6.8.2015 Correlative SEM and Raman Imaging of Hot Spots on SERS Substrate RISE Váňa, R., Kocman, M., Dluhoš, J, Štolcová, L. Jiruše, J.
ICAVS 8 12.-17.7.2015 Correlative SEM-SERS imaging of morphologically complex SERS-active substrates RISE Štolcová, L., Váňa, R., Proška, J.
Microscopy Conference (MC 2015) 6.-11.9.2015 Correlative SEM and SERS imaging of plasmonic nanostructures RISE Váňa R., Kocman M., Dluhoš J., Štolcová L., Jiruše J.
Microscopy Conference (MC 2015) 6.-11.9.2015 Imaging at Low Energies by a New Scintillation BSE Detector Low-energy SEM Kološová L., Havelka M., Petrov M., Jiruše J.,Horodyský P.
Microscopy Conference (MC 2015) 6.-11.9.2015 Ultra-high resolution FIB-SEM for semiconductors XEIA3 Jiruše J., Havelka M., Polster J., Hrnčíř T.
SIMS XX 13.-18.9.2015 Development of FIB-SIMS for Advanced Battery Research TOF-SIMS P. Hovington, S. Bessette, M. Lagacé, E. Principe, A. Guerfi, K. Zaghib
MMC 2015 29.6.- 2.7.2015 Nanoscale precision Time-Of-Flight mass spectrometry with improved mass resoluon within a SEM TOF-SIMS L. Sedláček, K. Klosová, J. Oboňa
Metal 2015 3.-5.6.2015 Study of Cerium segragation during solidification of low-carbon 42CrMo4 steel TOF-SIMS J. Drápala, S. Brožová, M. Madaj, G. Kostiuková, I. Szurman, K. Konečná, J. Vontorová, P. Machovčák, P. Jonšta, K. Klosová
17th International Conference on the Strength of Materials (ICSMA 17) 9.-14.8.2015 Accumulation of the damage on the surface of superelastic NiTi wire subjected to tensile cycling in simulated biofluid TOF-SIMS J. Racek , M. Stora , P. Šittner , L. Heller , M. Petrenec , V. Hertl

2014

SME 23-26/2 2014 Automated mineral analysis focused on large sample sets TIMA, AutoLoader V. Králová, D. Motl
Fraunhofer CAM workshop 9-10/4 2014 Optimal Strategies for Fast and Precise FIB Cross Sections of 3D Integrated Device Structures Plasma FIB for fast milling Tomáš Hrnčíř, Vladislav Hrachovec, Lukáš Hladík
CEMC 23-36/4 2014 TIMA TIMA V. Králová
EIPBN 27-30/5 2014 Electron, Ion and Photon Beams in a New Analytical and Prototyping Instrument SEM, FIB, SPM, TOF-SIMS, EDX and EBSD integrated J. Jiruše, M. Haničinec, M. Havelka
DH 13-17/6 2014 CCHM CCHM Tomáš Slabý, Pavel Kolman, Zbyněk Dostál, Martin Antoš, Martin Lošťák, Aneta Křížová, Jana Čolláková, Věra Kollářová, Michala Slabá, Pavel Veselý, Radim Chmelík
D-A-CH FIB workshop 23-24/6 2014 FERA, FERA+SIMS NA L. Sedláček, J. Dluhoš
MMC 1-3/7 2014 Differences in dynamics of cell activity in 3D collagen gel as visualized with coherence-controlled holographic microscope CCHM A. Křížová, V. Juzová, L. Tomášova, P. Veselý, and R. Chmelík
MMC 1-3/7 2014 Schottky field emission SEMs – multifunctional tool for biological applications Summary of trends in SEM B. Lencová, V. Košťál, J. Jiruše
MMC 1-3/7 2014 Coherence-controlled holographic microscope CCH Microscope T. Slabý, J. Pokorný, A. Křížová, M. Lošťák, L. Kvasnica, R. Chmelík, P. Kolman, M. Antoš
M&M 3-7/8 2014 New High-Resolution Low-Voltage and High Performance Analytical FIB-SEM System GAIA3 Jaroslav Jiruše, Miloslav Havelka, Martin Haničinec, Jan Polster, Tomáš Hrnčíř
M&M 3-7/8 2014 FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy GAIA Jaroslav Jiruše, Martin Haničinec, Miloslav Havelka, Olaf Hollricher, Wolfram Ibach, Peter Spizig
M&M 3-7/8 2014 Novel Cathodoluminescence Detector with Extremely Large Field of View CL Detector Jolana Kološová, Jaroslav Jiruše
M&M 3-7/8 2014 High Speed TEM Sample Preparation by Xe FIB FERA3 + ECR plasma FIB A. Delobbe, O. Salord, T. Hrnčíř, P. Sudraud, F. Lopour
M&M 3-7/8 2014 Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS FIB-SEM + TOF-SIMS Libor Sedláček, Jolana Kološová, Jaroslav Jiruše, Fred A. Stevie
CPO 31/8 - 5/9 2014 EOD B. Lencová
CPO 31/8 - 5/9 2014 Channelling J. Dluhoš, L. Sedláček
CPO 31/8 - 5/9 2014 On the Calculation of SEM and FIB Spot Sizes J. Jiruše, J. Kološová, T. Hrnčíř, M. Rudolf
IMC Prague 7-12/9 2014 A focused Xe+-ion column for fast materials sputtering at high spatial resolution to carry out time-of-flight mass spectrometry with nanoscale precision within a scanning electron microscope Combination of SEM and FIB, precise control + possibility of EDX, EBSD, TOF-SIMS measurement L.Sedláček, T. Hrnčíř, M. Latzel, B. Hoffmann, J. Jiruše, S. Christiansen
IMC Prague 7-12/9 2014 Integration of SPM module inside FIB-SEM instrument AFM + FIB-SEM M. Rudolf, L. Sedláček,J. Jiruše
IMC Prague 7-12/9 2014 High performance nanomachining using the new analytical FIB-SEM system GAIA Jaroslav Jiruše, Miloslav Havelka, Martin Haničinec, Jan Polster, Tomáš Hrnčíř
IMC Prague 7-12/9 2014 FIB-SEM Instrument with Integrated Raman Spectroscopy, Scanning Probe Microscopy and Secondary Ion Mass Spectroscopy Raman+TOF-SIMS+SPM Jaroslav Jiruše, Martin Haničinec, Miloslav Havelka, Olaf Hollricher, Oliver Schaff, Fredrik Oestlund, James Whitby, Johannes Michler
IMC Prague 7-12/9 2014 Ultra-Fast Three Dimensional Microanalysis Using the Scanning Electron Microscope Equipped with Xenon Plasma Focused Ion Beam Tomography by FIB slicing J. Dluhoš, M. Petrenec, P. Peřina, F. Reinauer, J. Kopeček,T. Hrnčíř, J. Jiruše
IMC Prague 7-12/9 2014 Multimodal Holographic Microscope Holographic microscope A. Křížová, T. Slabý, P. Kolman, J. Pokorný, Z. Dostál, M. Lošťák, L. Kvasnica, M. Antoš, R. Chmelík
IMC Prague 7-12/9 2014 Low-Voltage Imaging of Non-Conducting Samples MAIA - low voltage Jiří Beránek, Miloslav Havelka, Jaroslav Jiruše
IMC Prague 7-12/9 2014 Simultaneous panchromatic and color live cathodoluminescence imaging panchromatic CL Jolana Kološová, Jaroslav Jiruše
IMC Prague 7-12/9 2014 Application of Multi-Tilt Specimen Stage for Advanced Electron Channeling Contrast Technique Multi axial piezo stage Jiří Dluhoš, Libor Sedláček, Tomáš Ižák, Tomáš Hrnčíř, Jaroslav Jiruše
IMC Prague 7-12/9 2014 Novel strategies towards faster and smoother FIB cross-sectioning FIB-SEM Tomáš Hrnčíř, Jiří Dluhoš, Martin Haničinec and Vladislav Hrachovec
IMC Prague 7-12/9 2014 Correlative in-situ microscopy in materials and life science: Bringing Raman spectroscopy into the SEM Raman+SEM Björn Hoffmann, George Sarau, Martin Heilmann, Michael Latzel, Martin Haničinec,Jaroslav Jiruše, Silke Christiansen
IMC Prague 7-12/9 2014 Intorduction to MLA TIMA V. Králová
EMAS 21-24/9 2014 Intorduction to MLA TIMA V. Králová
E-MRS fall meeting 2014 15-19/9 2014 Demonstrating capabilities of TOF-SIMS analysis on a FIB-SEM instrument TOF-SIMS L. Sedláček, J. Jiruše
SIMS Europe 2014 7-9/9 2014 Depth Profiling of Single ZnO Nanorods with FIB TOF SIMS TOF-SIMS J. Lorinčík, R. Yatskiv, M. Verde, J. Grym, Z. Jarchovský, M. Hamplová

2013

SIMS XIX 29/9-4/10 2013 Imaging of Dopant Distribution in Optical Fibers with an Orthogonal TOF SIMS TOF-SIMS V. Králová, D. Motl
SIMS XIX 29/9-4/10 2013 FIB SIMS Quantification for TESCAN TOF-SIMS with Argon and Xenon Plasma Sources TOF-SIMS Tomáš Hrnčíř, Vladislav Hrachovec, Lukáš Hladík
73rd Physical Electronics conference 18-20/6 2013 FIB SIMS Quantification for TESCAN TOF-SIMS with Argon & Xenon Plasma Sources and with Oxygen Ion beam Enhanced Gallium Source TOF-SIMS V. Králová

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