2016

  1. Petráš R., Škorík V., Polák J.: Thermomechanical fatigue and damage mechanisms in Sanicro 25 steel. Materials Science and Engineering A, Vol. 650, 2016, p. 52-62. ISSN 0921-5093
  2. M. Viteau, M. Reveillard, L. Kime, B. Rasser, P. Sudraud, Y. Bruneau, G. Khalili, P. Pillet, D. Comparat, I. Guerri, A. Fioretti, D. Ciampini, M. Allegrini, F. Fuso: Ion microscopy based on laser-cooled cesium atoms, 2016, ArXiv e-prints

2015

  1. Haluzová, E., Ackerman, L., Pašava, J., Jonášová, Š., Svojtka, M., Hrstka, T. & Veselovský, F. (2015) Geochronology and characteristics of Ni-Cu-(PGE) mineralization at Rožany, Lusatian Granitoid Complex, Czech Republic, Journal of Geosciences, 60, 219-236.
  2. Audrey Garnier, G. Filoni, T. Hrncír, L. Hladík: Plasma FIB: Enlarge your field of view and your field of applications. Microelectronics Reliability 55(9-10): 2135-2141 (2015)
  3. A. Weidner, D. Krewerth, H. Biermann: Ermüdung bei sehr hohen Lastspielzahlen (VHCF) - Fraktografie, in: H. Biermann, L. Krüger, (Hrsg.): Moderne Methoden der Werkstoffprüfung, 2015, WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany
  4. Liming, Lu: TESCAN integrated mineral analyzer - Quantitative analysis of iron ore using SEM-based technologies, in: Iron Ore - Mineralogy, Processing and Environmental Sustainability, 2015, Elsevier Ltd., Cambridge
  5. J. Drápala, S. Brožová, M. Madaj, G. Kostiuková, I. Szurman, K. Konečná, J. Vontorová, P. Machovčák, P. Jonšta, K. Klosová: Study of Cerium segragation during solidification of low-carbon 42CrMo4 steel, Metal 2015 Proceedings.
  6. Khatibi Shahidi M., Krivanek J., Kaukua N., Ernfors P., Hladik L., Kostal V., Masich S., Hampl A., Chubanov V., Gudermann T., Romanov RA., Harkany T., Adameyko I., Fried K.; Three-dimensional Imaging Reveals New Compartments and Structural Adaptations in Odontoblasts. Journal of dental research 945-54 (2015).
  7. N Dzigal, E Chinea-Cano: Correlative Microscopy Techniques for the Analysis of Particles in Safeguards Environmental Samples, Conference Series Edition of the Institute of Physics Journal, 2015.
  8. T. Sui, B. Song, J. Dluhos, L. Lu, A.M. Korsunsky, Nanoscale chemical mapping of Li-ion battery cathode material by FIB-SEM and TOF-SIMS multi-modal microscopy, Nano Energy, Volume 17, October 2015, Pages 254-260, ISSN 2211-2855, DOI: 10.1016/j.nanoen.2015.08.013.
  9. Dědková K., Janíková B., Matějová K., Čabanová K., Váňa R., Kalup A., Hundáková M., Kukutschová J.: ZnO/graphite composites and its antibacterial activity at different conditions, Journal of Photochemistry and Photobiology B Biology (Impact Factor: 2.96). 09/2015; 151:256-263. DOI: 10.1016/j.jphotobiol.2015.08.017
  10. T. Hrnčíř, J. V. Oboňa, M. Petrenec, J. Michalička, Ch. Lang: How Xe and Ga FIB differ in inducing lateral damage on TEM samples, ISTFA 2015: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis (2015)
  11. W. Bluma, J. Dvořák, P. Král, M. Petrenec, P. Eisenlohr, V. Sklenička, In situ study of microstructure and strength of severely predeformed pure Cu in deformation at 573K, Philosophical Magazine, 2015
  12. A.J.G. Lunt, N. Baimpas, E. Salvati, I. Dolbyna, T. Sui, S. Ying, H. Zhang, A. Kleppe, J. Dluhos, A.M. Korsunsky, A state-of-the-art review of micron scale spatially re-solved residual stress analysis by ring-core milling and other techniques, J. Strain Anal. Eng. 50 (2015) 426–444
  13. A.J.G. Lunt, et al., A comparative transmission electron microscopy, energy dispersive x-ray spectroscopy and spatially resolved micropillar compression study of the yttria partially stabilised zirconia - porcelain interface in dental prosthesis, Thin Solid Films (2015)
  14. J.P. Best, et al.: A comparison of three different notching ions for small-scale fracture toughness measurement, Scripta Materialia (2015)
  15. J. Kološová, T. Hrnčíř, J. Jiruše, M. Rudolf, J. Zlámal (2015). On the Calculation of SEM and FIB Beam Profiles. Microscopy and Microanalysis, 21 (Suppl. 4) , pp 206-211. doi:10.1017/S1431927615013380.

2014

  1. Kohout et al. 2014. Density, porosity, mineralogy, and internal structure of cosmic dust and alteration of its properties during high velocity atmospheric entry, MAPS, 49, 1157–1170. DOI: 10.1111/maps.12325
  2. Petrenec, M., Polák, J., Šamořil, T., Dluhoš, J., Obrtlík, K.: In Situ Study of the Mechanisms of High Temperature Damage in Elastic-Plastic Cyclic Loading of Nickel Superalloy. Advanced Materials Research 891-892, 530–535 (2014).
  3. Man, J. et al. AFM and SEM-FEG study on fundamental mechanisms leading to fatigue crack initiation. International Journal of Fatigue doi:10.1016/j.ijfatigue.2014.09.019
  4. Barbi, N. C., Lopour, F., Piemonte, C. & Mott, R. B. Electron detector including an intimately-coupled scintillator-photomultiplier combination, and electron microscope and X-ray detector employing same. (2014).
  5. Jiruse, J. et al. FIB-SEM Instrument with Integrated Raman Spectrscopy for Correlative Microscopy. Microscopy and Microanalysis 20, 990–991 (2014).
  6. Stevie, F. A. et al. FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources. Surf. Interface Anal. 46, 285–287 (2014).
  7. Delobbe, A. et al. High Speed TEM Sample Preparation by Xe FIB. Microscopy and Microanalysis 20, 298–299 (2014).
  8. Lorinčík, J., Kašík, I., Vaniš, J., Sedláček, L. & Dluhoš, J. Imaging of dopant distribution in optical fibers with an orthogonal TOF SIMS. Surf. Interface Anal. 46, 238–240 (2014).
  9. Sedláček, L., Kološová, J., Jiruše, J. & Stevie, F. A. Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS. Microscopy and Microanalysis 20, 306–307 (2014).
  10. Jiruše, J. et al. Integrating focused ion beam–scanning electron microscope with confocal Raman microscope into a single instrument. Journal of Vacuum Science & Technology B 32, 06FC03 (2014).
  11. Xu, C. et al. Nanoparticle and nanosphere mask for etching of ITO nanostructures and their reflection properties. Phys. Status Solidi A n/a–n/a (2014). doi:10.1002/pssa.201431228
  12. Baimpas, N., Lunt, A. J. G., Dolbnya, I. P., Dluhos, J. & Korsunsky, A. M. Nano-scale mapping of lattice strain and orientation inside carbon core SiC fibres by synchrotron X-ray diffraction. Carbon 79, 85–92 (2014).
  13. Mishnaevsky Jr., L. et al. Nanostructured titanium-based materials for medical implants: Modeling and development. Materials Science and Engineering: R: Reports 81, 1–19 (2014).
  14. Jiruše, J., Havelka, M., Haničinec, M., Polster, J. & Hrnčíř, T. New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System. Microscopy and Microanalysis 20, 1104–1105 (2014).
  15. Kološová, J. & Jiruše, J. Novel Cathodoluminescence Detector with Extremely Large Field of View. Microscopy and Microanalysis 20, 912–913 (2014).
  16. Jiruše, J., Havelka, M. & Lopour, F. Novel field emission SEM column with beam deceleration technology. Ultramicroscopy 146, 27–32 (2014).
  17. Chaaya, A. A. et al. Optical and structural properties of Al2O3/ZnO nanolaminates deposited by ALD method. Phys. Status Solidi C 11, 1505–1508 (2014).
  18. Kopeček, J. et al. Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl. Microscopy and Microanalysis 20, 334–335 (2014).
  19. Krenkovaa,J., Ceslab, P., Foret, F. MACROPOROUS CRYOGEL BASED SPIN COLUMN WITH IMMOBILIZED CONCANAVALIN A FOR ISOLATION OF GLYCOPROTEINS
  20. D. Alberts, L. von Werra, F. Oestlund, U. Rohner, M. Hohl, J. Michler, J.A. Whitby: Design and performance of two orthogonal extraction Time-Of-Flight secondary ion mass spectrometers for focused ion beam instruments, Instr. Sci. Technol 42 (4) 2014, doi: 10.1080/10739149.2013.878843
  21. Polák J., Petráš R., Heczko M., Kuběna I., Kruml T., Chai G.: Low cycle fatigue behavior of Sanicro 25 steel at room and at elevated temperature elevated temperature. Materials Science and Engineering A, Vol. 615, 2014, p. 175-182. ISSN: 0921-5093
  22. Tomáš Hrnčíř, Jiří Dluhoš, Tescan Brno; Lukáš Hladík, Tescan Orsay Holding; Efrat Moyal, Janet Teshima, LatticeGear, LLC; Jaromír Kopeček, Institute of Physics ASCR: Advances in FIB-SEM Analysis of TSV and Solder Bumps—Approaching Higher Precision, Throughput, and Comprehensiveness, ISTFA 2014: Proceedings of the 40th International Symposium for Testing and Failure Analysis (2014)

OLDER

  1. J.A. Whitby, F. Ostlund, P. Horvath, M. Gabureac, J.L. Riesterer, I. Utke, M. Hohl, L. Sedlacek, J. Jiruse, F. Friedli, M. Bechelany, J. Michler: High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with in situ AFM, Adv. Mat. Sci. Eng., Vol. 2012, pages 1–13, Article ID 180437.
  2. Petrenec M., Tesařová H., Krahula K., Polák J.: Elastic-plastic behaviour of advanced adi studied by in-situ SEM tensile test. METAL 2013 Conference Proceedings. 22nd International Conference on Metallurgy and Materials, ISBN 978-80-87294-41-3
  3. Petrenec M., Strunz P., Gasser U., Heczko M., Zálešák J., Polák J.: Nanostructure characterization of IN738LC superalloy fatigued at high temperature. NANOCON 2013 Conference Proceedings.
  4. J. Čechal, O. Tomanec, D. Škoda, K. Koňáková, T. Hrnčíř, J. Mach, M. Kolíbal, T. Šikola: Selective growth of Co islands on ion beam induced nucleation centers in a native SiO2 film, J. Appl. Phys. 105 (2009), 084314. (IF 2.168)
  5. T. Hrnčíř, F. Lopour, M. Zadražil, TESCAN a.s.; A. Delobbe, O. Salord, P. Sudraud, Orsay Physics S.A.: Novel Plasma FIB/SEM for High Speed Failure Analysis and Real Time Imaging of Large Volume Removal, ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis (2012)
  6. Hrncir, T.; Hladik, L.; Zadrazil, M., "Fast 3D tomography at package level by using Xe plasma focused ion beam," in Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the , vol., no., pp.112-115, 15-19 July 2013
  7. Hrncir, T.; Hladik, L.: Fast and Precise 3D Tomography of TSV by Using Xe Plasma FIB, ISTFA 2013: Proceedings from the 39th International Symposium for Testing and Failure Analysis, A Complete Proceedings
  8. Sun, X Luo, J Ritchie, and T Hrncir: A predictive divergence compensation approach for the fabrication of three-dimensional microstructures using focused ion beam machining, Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture, 2011
  9. Urbánek, M, V Uhlír, P Bábor, E Kolíbalová, T Hrncír, J Spousta, and T Sikola. 2010. Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process. Nanotechnology 21, no. 14: 145304.
  10. M. Urbánek, T. Šikola, L. Hladík, T. Hrnčír, J. Jiruše: Combined EBL/IBL Nanopatterning on Silicon Nitride Membranes for Time-resolved Magnetic Transmission X-ray Microscopy Experiments, Microscopy and Microanalysis,Volume 19,Supplement S2,2013,pp 872-873
  11. Zadrazil, M.; Jiruse, J.; Lencova, B.; Dluhos, J.; Hrncir, T.; Rudolf, M.; Sedlacek, L.; Samoril, T., "The step towards an ultimate multifunctional tool for nanotechnology," in Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on , vol., no., pp.175-179

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